Breakthrough in EDS technology

Advanced Materials and Processes

Volumn 166, Issue 3, 2008, Pages 41-43

  Friel, John J ^a  

^a TEMPLE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; ENERGY DISPERSIVE X RAY ANALYSIS; SILICON DETECTORS; SPECTRAL RESOLUTION; SPECTROMETRY;

ENERGY DISPERSIVE SPECTROMETRY (EDS); SILICON DRIFT DETECTORS (SDDS); X-RAY MICROANALYSIS;

SILICON ALLOYS;

EID: 42249108819     PISSN: 08827958     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (5)

1. Gatti E., and P. Rehak, Nucl. Instrum. Methods A, 1984 42, 12.
2. Lechner, P., Pahlke, A., and H. Soltau, X-ray Spectrometry, 2004, 33: 256.
3. Niculae, A., Soltau, H., Liebl, A., Lutz, G., Strüder, L. and R. Eckhart, Microscopy and Microanalysis 13 (suppl 2), 2007, 1430CD.
4. Mott, R. B. Microscopy and Microanalysis 13 (suppl 2), 2007, 1434CD.
5. Statham, P. J., Microscopy and Microanalysis 13 (suppl 2), 2007, 1428CD.