Progress in the X-ray optics & metrology lab at diamond light source

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6704, Issue , 2007, Pages

  Alcock, Simon G ^a   Sawhney, K J S ^a  

^a DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

Interferometry; Metrology; X ray optics

Indexed keywords

INTERFEROMETERS; INTERFEROMETRY; LIGHT SOURCES; OPTIMIZATION; SYNCHROTRONS;

COMPLEMENTARY TECHNIQUES; SLOPE MEASURING PROFILING SYSTEMS; SYNCHROTRON OPTICS;

X RAY OPTICS;

EID: 42149195374     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.737843     Document Type: Conference Paper

References (4)

1. S. G. Alcock, L. Alianelli and K.J.S Sawhney, "X-ray optics for beamlines at Diamond Light Source", Proceedings of SPIE, Volume 6317, 63170C (2006).
2. R. Signorato, D. Hausermann and M. Somayazulu, "Performance of an adaptive μ-focusing Kirkpatrick-Baez system for high-pressure studies at the Advanced Photon Source", Proceedings of SPIE, Volume 5193, pp. 112-123, (2004).
3. R. Signorato and T. Ishikawa, "R&D on third generation multi-segmented piezoelectric bimorph mirror substrates at Spring-8", Nucl. Inst. A, 467, Part 1, pp 271-274, (2001).
4. K. R. Freischlad, "Absolute interferometric testing based on reconstruction of rotational shear", Applied Optics, Vol. 40, Number 10, pp 1637-1648, (2001), and references cited within.