Optical constants of evaporated gold films measured by surface plasmon resonance at telecommunication wavelengths

Journal of Applied Physics

Volumn 103, Issue 7, 2008, Pages

  Lee, Wook Jae ^a   Kim, Jae Eun ^a   Park, Hae Yong ^a   Park, Suntak ^b   Kim, Min Su ^b   Kim, Jin Tae ^a,b   Ju, Jung Jin ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING; ELECTRIC CONDUCTIVITY; ELLIPSOMETRY; EVAPORATION; GOLD; OPTICAL CONSTANTS; SURFACE PLASMON RESONANCE; WAVELENGTH;

GOLD FILMS; TELECOMMUNICATION WAVELENGTHS; TOTAL REFLECTION DEVICES;

METALLIC FILMS;

EID: 42149193123     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2902395     Document Type: Article

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