Free-carrier compensation in ferromagnetic ion-implanted SnO2:Co

Journal of Applied Physics

Volumn 103, Issue 7, 2008, Pages

  Menzel, D ^a   Awada, A ^a   Dierke, H ^a   Schoenes, J ^a   Ludwig, F ^a   Schilling, M ^a  

^a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; FERROMAGNETIC MATERIALS; ION IMPLANTATION; MAGNETRON SPUTTERING; THIN FILMS;

ELECTRICAL TRANSPORT MEASUREMENTS; ENERGY LOSS SPECTROSCOPY; FREE-CARRIER COMPENSATION; ROOM TEMPERATURE;

TIN DIOXIDE;

EID: 42149186485     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2830796     Document Type: Conference Paper

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