Film thickness dependence of the enhanced EuS interface ordering temperature in EuS/Co thin films

Journal of Applied Physics

Volumn 103, Issue 7, 2008, Pages

  Volobuev, V V ^a,b   Stetsenko, A N ^b   Van Lierop, J ^a  

^a UNIVERSITY OF MANITOBA   (Canada)

^b NATIONAL TECHNICAL UNIVERSITY   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); MAGNETISM; THERMAL EFFECTS; THIN FILMS;

INTERFACE MOMENTS; ORDERING TEMPERATURES;

FILM THICKNESS;

EID: 42149179293     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2832627     Document Type: Conference Paper

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