Limitations of Rayleigh Rice Perturbation Theory for describing surface scatter

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6672, Issue , 2007, Pages

  Stover, John C ^a   Harvey, James E ^b  

^a Scatter Works Inc   (United States)

^b UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

BRDF; PSD; Surface scatter; Surface topography

Indexed keywords

SCATTER PATTERNS; SPECTRAL DENSITY FUNCTION (PSD); SURFACE REFLECTORS;

PERTURBATION TECHNIQUES; POLARIZATION; SPECTRAL DENSITY; SURFACE TOPOGRAPHY; WAVELENGTH;

RAYLEIGH WAVES;

EID: 42149161232     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.739133     Document Type: Conference Paper

References (4)

1. Church, E.L., Zavada, J.M., "Residual roughness of diamond-turned optics," Appl. Opt. vol 14, p1788 (1975).
2. Church, E.L., Jenkunson, H.A., Zavada, J.M., "Relationship between surface scattering and microtopographic features," Opt. Eng. vol 18, no. 2, 125-136. (1979).
3. Stover, J.C., M.L. Bernt, "Wavelength scaling investigation of several materials, Proc SPIE 1995 p256-266 (1993).
4. Stover, J.C., Optical Scattering: Measurement and Analysis: Second Edition, SPIE (1995).