Using Bond Valence sums as restraints in XAFS analysis

Physica Scripta T

Volumn T115, Issue , 2005, Pages 159-161

  Newville, M ^a  

^a UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; IRON OXIDES; MOLECULAR DYNAMICS; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

BOND DISTANCE; BOND VALENCE SUMS;

VALENCE BANDS;

EID: 42149157756     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1238/Physica.Topical.115a00159     Document Type: Article

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