Liquids identification with x-ray diffraction

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6707, Issue , 2007, Pages

  Harding, G ^a   Delfs, J ^b  

^a GE Security Germany GmbH   (Germany)

^b UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR STRUCTURE; PARAMETER ESTIMATION; X RAY DIFFRACTION;

ATOMIC NUMBER; PARTICLE HOMOGENEITY;

AMORPHOUS ALLOYS;

EID: 42149155533     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.740290     Document Type: Conference Paper

References (11)

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