Evaluation of 0.5 mm thick double-sided silicon strip detector for Compton telescope

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6706, Issue , 2007, Pages

  Yasuda, Hajimu ^a   Fukazawa, Yasushi ^a   Takeda, Shin'ichiro ^b   Watanabe, Shin ^b   Takahashi, Tadayuki ^b   Nakazawa, Kazuhiro ^c   Tajima, Hiroyasu ^d   Tanaka, Takaaki ^d  

^a HIROSHIMA UNIVERSITY   (Japan)

^b JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

^d SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

Compton telescope; Gamma ray; Silicon strip detector; SSD; X ray

Indexed keywords

COMPTON SCATTERING; GAMMA RAYS; OPTICAL TELESCOPES; PIXELS; X RAY OPTICS;

COMPTON TELESCOPES; PIXEL DETECTORS; SILICON STRIP DETECTORS (SSD);

SEMICONDUCTOR DETECTORS;

EID: 42149120129     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.735147     Document Type: Conference Paper

References (9)

1. V. Schoenfelder et al., Astroph. J. Suppl. Series 86, pp. 657-692, 1993
2. T. Kamae et al., Niel. Instr. and Meth. A., vol. 260, p. 254, 1987.
3. H. Tajima et al., IEEE Trans.Nucl.Sci. NS51 (2004) 197
4. K. Nakazawa et al., Nucl. Instr. and Meth.A., vol. 573, p. 44-47, 2007.
5. Y. Fukazawa et al., Nucl. Instr. and Meth.A., vol. 541, p. 342-349, 2005.
6. A. Zoglauer et al., Proc. SPIE-Int. Soc. Opt. Eng., vol. 4851, 99.1302-1309, 2003
7. T. Takahashi et al., Proc. SPIE-Int. Soc. Opt. Eng., vol. 4851, 99.1228-1235, 2003
8. S. Takeda et al., Nucl. Instr. and Meth. A vol. 579 p. 8597865, 2007
9. H. Tajima et al., Proc SPIE-Int. Soc. Opt. Eng., vol., 4851, p. 875-884 2003