Lifetime-broadening-removed XANES spectroscopy by high-resolution resonant inelastic x-ray scattering

Physica Scripta T

Volumn T115, Issue , 2005, Pages 1094-1096

  Hayashi, H ^a   Takeda, R ^a   Udagawa, Y ^a   Nakamura, T ^b,c   Miyagawa, H ^b,d   Shoji, H ^b,e   Nanao, S ^b   Kawamura, N ^c  

^a TOHOKU UNIVERSITY   (Japan)

^b INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^d KAGAWA UNIVERSITY   (Japan)

^e SEMICONDUCTOR ENERGY LABORATORY CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DISTRIBUTION FUNCTIONS; NUMERICAL METHODS; OPTICAL RESOLVING POWER; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY SCATTERING;

KRAMERS-HEISENBERG EQUATION; RESONANT INELASTIC X-RAY SCATTERING (RIXS);

OSCILLATORS (ELECTRONIC);

EID: 42149112145     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1238/Physica.Topical.115a01094     Document Type: Article

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