Magnetic force microscopy imaging of in-plane magnetic field gradient using transient oscillation

Journal of Applied Physics

Volumn 103, Issue 7, 2008, Pages

  Saito, H ^a   Egawa, G ^a   Ishio, S ^a   Li, Guoqing ^b  

^a AKITA UNIVERSITY   (Japan)

^b SOUTHWEST UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING SYSTEMS; MAGNETIC FORCE MICROSCOPY; MAGNETIZATION; TRANSIENT ANALYSIS;

FREQUENCY SHIFT; MAGNETIC FIELD GRADIENT; TRANSIENT OSCILLATION;

MAGNETIC FIELD MEASUREMENT;

EID: 42149105677     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2844709     Document Type: Conference Paper

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