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Volumn 6724, Issue , 2007, Pages

Simulation on signal processing of focusing and leveling measurement system

Author keywords

Focusing and leveling; Photolithography; Signal processing; Simulation

Indexed keywords

COMPUTER SIMULATION; FOCUSING; PHOTOLITHOGRAPHY; POSITION MEASUREMENT; PROJECTION SYSTEMS; SIGNAL PROCESSING;

EID: 42149104687     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.782958     Document Type: Conference Paper
Times cited : (10)

References (7)
  • 1
    • 42149139499 scopus 로고    scopus 로고
    • Jan E. van der werf, Marinus A. van den Brink, Imaging Apparatus Having a Focus-error and/or Tilt Detection Device, United States patent, 5191200.
    • Jan E. van der werf, Marinus A. van den Brink, Imaging Apparatus Having a Focus-error and/or Tilt Detection Device, United States patent, 5191200.
  • 2
    • 42149166173 scopus 로고    scopus 로고
    • Yamada Y, Uzawa S, Surface Position Detecting Method and Scanning Exposure Method Using the Same, United States patent, 5920398.
    • Yamada Y, Uzawa S, Surface Position Detecting Method and Scanning Exposure Method Using the Same, United States patent, 5920398.
  • 3
    • 42149150507 scopus 로고    scopus 로고
    • van der Werf J E, Biesterbos JWM, Optical Imaging Arrangement Comprising an Opto-electronic Focusing-error Detection System, United States patent, 4866262.
    • van der Werf J E, Biesterbos JWM, Optical Imaging Arrangement Comprising an Opto-electronic Focusing-error Detection System, United States patent, 4866262.
  • 4
    • 42149096634 scopus 로고    scopus 로고
    • van der Werf J E, Optical Focus and Level Sensor for Wafer Steppers, J. Vac. Sci. Technol. B (10)2, 735-740(1992).
    • van der Werf J E, Optical Focus and Level Sensor for Wafer Steppers, J. Vac. Sci. Technol. B (10)2, 735-740(1992).
  • 7
    • 85076467571 scopus 로고
    • Focusing and Leveling System Using PSDs for the Wafer Steppers
    • Kim D H, Jang W I, Choi B Y, et al, Focusing and Leveling System Using PSDs for the Wafer Steppers, Proc. SPIE 2197,997-1003 (1994).
    • (1994) Proc. SPIE , vol.2197 , pp. 997-1003
    • Kim, D.H.1    Jang, W.I.2    Choi, B.Y.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.