Customization of an in-house XAFS spectrometer for sulfur measurement

Physica Scripta T

Volumn T115, Issue , 2005, Pages 1017-1018

  Taguchi, T ^a   Shinoda, K ^b   Tohji, K ^b  

^a RIGAKU CORPORATION   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ENVIRONMENTAL IMPACT; PROBLEM SOLVING; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

ATOMIC NUMBERS; ENVIRONMENTAL STUDIES;

SULFUR;

EID: 42149095884     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1238/Physica.Topical.115a01017     Document Type: Article

References (5)

1. Taguchi T et al 2001 J. Synchrotron Rad. 8 363
2. Taguchi T 2001 Analytical Sciences 17 Supplement i139-i141
3. Taguchi T, Harada J, Tohji K and Shinoda K 2002 Adv. X-ray Anal. 45 397
4. Knapp G S 1980 Laboratory EXAFS Facilities (ed E A Stern) (AIP, New York) p8
5. Ohta T 2002 X-ray Absorption Spectrometry (XAFS) and its application (IPC) 115-127