Highly accurate THz time-domain spectroscopy of multilayer structures

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 14, Issue 2, 2008, Pages 392-398

  Wilk, Rafal ^a,b,c   Pupeza, Ioachin ^a,b,d   Cernat, Radu ^e,f   Koch, Martin ^b,g  

^a IEEE

^b TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^c MENLO SYSTEMS GMBH   (Germany)

^d MAX PLANCK INSTITUT FÜR QUANTENOPTIK   (Germany)

^e TU DORTMUND UNIVERSITY   (Germany)

^f SIEMENS AG   (Germany)

^g UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Signal processing; Spatially variant moving average filter (SVMAF); Spectroscopy; TDS; Terahertz

Indexed keywords

OPTICAL MATERIALS; PARAMETER ESTIMATION; SPECTROSCOPIC ANALYSIS; THICKNESS MEASUREMENT; TIME DOMAIN ANALYSIS; TRANSFER FUNCTIONS;

CUVETTES; SPATIALLY VARIANT MOVING AVERAGE FILTER (SVMAF); TIME-DOMAIN SPECTROSCOPY;

MULTILAYERS;

EID: 41949088858     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2007.910981     Document Type: Article

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