|
Volumn , Issue , 2003, Pages 77-80
|
Obtaining accurate IMD variation and imbalance measurements for identifying memory effects in high-power amplifiers
a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
DESIGN FOR TESTABILITY;
MICROWAVE MEASUREMENT;
DEVICE UNDER TEST;
HIGH OUTPUT;
HIGH POWER AMPLIFIER;
MEMORY EFFECTS;
THIRD ORDER INTERMODULATION;
POWER AMPLIFIERS;
|
EID: 41849150754
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ARFTGF.2003.01459756 Document Type: Conference Paper |
Times cited : (1)
|
References (9)
|