Mixed method based on intrapulse data and radiated emission to emitter sources recognition

16th International Conference on Microwaves, Radar and Wireless Communications, MIKON 2006

Volumn , Issue , 2006, Pages 487-490

  Kawalec, Adam ^a   Rapacki, Tomasz ^a   Wnuczek, Stanisław ^a   Dudczyk, Janusz ^b   Owczarek, Robert ^a  

^a MILITARY UNIVERSITY OF TECHNOLOGY   (Poland)

^b NONE   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; INTELLIGENT SYSTEMS; RADAR SYSTEMS; SIGNAL ANALYSIS; SPECTRUM ANALYSIS;

ELECTROMAGNETIC SPECTRUM; INTRAPULSE ANALYSIS; RADIATED EMISSION;

ELECTROMAGNETIC WAVE EMISSION;

EID: 41849127884     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MIKON.2006.4345225     Document Type: Conference Paper

References (8)

1. L. E. Langley, "Specific Emitter Identification (SEI) and Classical Parameter Fusion Technology", IEEE WESCON/'93 Conference Record, San Francisco, 28-30 September 1993.
2. R. Owczarek, "Automatyczne rozpoznawanie radarów na podstawie analizy ich sygnałów w mikroskali czasowej", IV Krajowa Konferencja nt.: "Metody i systemy komputerowe w badaniach naukowych i projektowaniu inżynierskim", Kraków, 26-28 listopada 2003.
3. R. Owczarek, "Problemy specyficznej identyfikacji źródeł emisji radarowych", V Konferencja Naukowo-Techniczna nt.: "Systemy rozpoznania i walki radioelektronicznej", Warszawa, 18-19 listopada 2002.
4. th International Conference on Microwaves, Radar and Wireless Communications, Warsaw, Poland, May 2004, vol. 2, pp. 431-434.
5. J. Dudczyk, "Applying the Radiated Emission to the Radio-electronic Devices Identification," Ph.D. Dissertation, Electronics, Military Univ. of Technology, Warsaw, Poland, 2004.
6. Z. Hellwig, Theory of Probability and Mathematical Statistics. Warsaw, Poland: Scientific Press PWN, 1998, pp. 125-134.
7. K. Fukunaga, Introduction to statistical pattern recognition. Second ed. Academic Press, New York 1990.R.
8. O. Duda, P. E. Hart and D. G. Stork, Pattern Classification. New York, USA: John Wiley & Sons, 2000.