Utilizing the lability of lead selenide to produce heterostructured nanocrystals with bright, stable infrared emission

Journal of the American Chemical Society

Volumn 130, Issue 14, 2008, Pages 4879-4885

  Pietryga, Jeffrey M ^a   Werder, Donald J ^a   Williams, Darrick J ^a   Casson, Joanna L ^a   Schaller, Richard D ^a   Klimov, Victor I ^a   Hollingsworth, Jennifer A ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HETEROSTRUCTURED NANOCRYSTALS; SPECTRAL SHIFTING;

HETEROJUNCTIONS; INFRARED RADIATION; ION EXCHANGE; NANOCRYSTALS; POSITIVE IONS; SYNTHESIS (CHEMICAL);

SEMICONDUCTOR QUANTUM DOTS;

LEAD SELENIDE; QUANTUM DOT; SELENIDE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL REACTION; CRYSTAL STRUCTURE; CRYSTALLIZATION; ENVIRONMENTAL TEMPERATURE; INFRARED RADIATION; MOLECULAR STABILITY; QUANTUM YIELD; STRUCTURE ANALYSIS; SYNTHESIS;

EID: 41849124959     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja710437r     Document Type: Article

References (31)

1. Achermann, M.; Petruska, M. A.; Koleske, D. D.; Crawford, M. H.; Klimov, V. I. Nano Lett. 2006, 6, 1396-400.
2. Klimov, V. I.; Bawendi, M. G. MRS Bull. 2001, 26, 998-1004.
3. Somers, R. C.; Bawendi, M. G.; Nocera, D. G. Chem. Soc. Rev. 2006, 36, 579-91.
4. Medintz, I. L.; Tetsuo, H. U.; Goldman, E. R.; Mattoussi, H. Nat. Mater. 2005, 4, 435-36.
5. Klink, S. I.; Keizer, H.; van Veggel, F. C. J. M. Angew. Chem., Int. Ed. 2000, 39, 4319-21.
6. Murray, C. B.; Sun, S.; Gaschler, W.; Doyle, H.; Betley, T. A.; Kagan, C. R. IBM J. Res. Dev. 2001, 45, 47-55.
7. Du, H.; Chen, C.; Krishnan, R.; Krauss, T. D.; Harbold, J. M.; Wise, F. W.; Thomas, M. G.; Silcox, J. Nano Lett. 2002, 2, 1321-4.
8. Wehrenberg, B. L.; Wang, C.; Guyot-Sionnest, P. J. Phys. Chem. B 2002, 106, 10634-40.
9. Pietryga, J. M.; Schaller, R. D.; Werder, D.; Stewart, M. H.; Klimov, V. I.; Hollingsworth, J. A. J. Am. Chem. Soc. 2004, 126, 11752-3.
10. Schaller, R. D.; Petruska, M. A.; Klimov, V. I. J. Phys. Chem. B 2003, 107, 13765-8.
11. Schaller, R. D.; Klimov, V. I. Phys. Rev. Lett. 2004, 92, 186601/1-4.
12. Schaller, R. D.; Sykora, M.; Pietryga, J. M.; Klimov, V. I. Nano Lett. 2006, 6, 424-9.
13. Pietryga, J. M.; Casson, J. L.; Schaller, R. D.; Klimov, V. I.; Hollingsworth, J. A. Prepr. Pap - Am. Chem. Soc., Div. Fuel Chem. 2007, 52, 822-3.
14. Sapra, S.; Nanda, J.; Pietryga, J. M.; Hollingsworth, J. A.; Sarma, D. D. J. Phys. Chem. B 2006, 110, 15244-50.
15. Stouwdam, J. W.; Shan, J.; van Veggel, F. C. J. M.; Pattantyus-Abraham, A. G.; Young, J. F.; Raudsepp, M. J. Phys. Chem. C 2007, 111, 1086-92.
16. Lobo, A.; Moller, T.; Nagel, M.; Borchert, H.; Hickey, S. G.; Weller, H. J. Phys. Chem. B 2005, 109, 17422-17428.
17. Kirchner, C.; Liedl, T.; Kudera, S.; Pellegrino, T.; Javier, A. M.; Gaub, H. E.; Stolzle, S.; Fertig, N.; Parak, W. J. Nano Lett. 2005, 5, 331-338.
18. Derfus, A. M.; Chan, W. C. W.; Bhatia, S. N. Nano Lett. 2004, 4, 11-18.
19. Hines, M. A.; Scholes, G. D. Adv. Mater. 2003, 15, 1844-1849.
20. Hines, M. A.; Guyot-Sionnest, P. J. Phys. Chem. 1996, 100, 468-71.
21. Son, D. H.; Hughes, S. M.; Yin, Y.; Alivisatos, A. P. Science 2004, 306, 1009-12.
22. 2-cooled InSb detector with a grating monochromator. The excitation was mechanically chopped, and the signal was enhanced by a lock-in amplifier.
23. SAXS analyses were performed on NQDs in hexane solutions with a transmission coefficient between 30% and 50% in a 1 mm capillary tube using a Rigaku Ultima III diffractometer with a Cu Kα (1.5406) X-ray source and "Nano-Solver" (by Rigaku) analysis software. The scattering range was from 2θ = 0.1000-6.0000°. For each sample, an empty capillary background was subtracted from the raw data prior to profile fitting.
24. Elemental analyses were performed by Galbraith Laboratories, Inc., Knoxville, TN, 37950-1610.
25. Hankare, P. P.; Delekar, S. D.; Chate, P. A.; Sabane, S. D.; Garadkar, K. M.; Bhuse, V. M. Semicond. Sci. Technol. 2005, 20, 257-64.
26. XRD patterns were collected on a Rigaku Ultima III diffractometer that using a Cu Kα (1.5406 Å) X-ray source. The thick, solid NQD films were drop cast onto zero-background silicon substrates.
27. TEM studies were done on a JEOL 2010 operating at 200 kV and a FEI Tecnai G2 30 (S)TEM operating at 300 kV.
28. Chance, B. Ann. N.Y. Acad. Sci. 1998, 838, 29-45.
29. Elemental analyses were performed on a FEI Tecnai G2 30 (S)TEM operating at 300 KV using an EDAX EDAM III energy-dispersive spectrometer with a Si(Li) detector. FEI TIA software was used to analyze the collected data.
30. Steckel, J. S.; Yen, B. K. H.; Oertel, D. C.; Bawendi, M. G. J. Am. Chem. Soc. 2006, 128, 13032-3.
31. Lee, J.; Sundar, V. C.; Heine, J. R.; Bawendi, M. G.; Jensen, K. F. Adv. Mater. 2000, 12, 1102-5.