Texture of submicron Ni-Mn-Ga films studied by X-ray diffraction at the ANKA synchrotron source

Zeitschrift fur Kristallographie, Supplement

Volumn 2, Issue 26, 2007, Pages 229-234

  Chernenko, V A ^a   Doyle, S ^b   Kohl, M ^b   Mullner P ^c   Besseghini, S ^d   Ohtsuka, M ^e  

^a INSTITUTE OF MAGNETISM   (Ukraine)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c Boise State University   (United States)

^d CNR   (Italy)

^e TOHOKU UNIVERSITY   (Japan)

Author keywords

Ni Mn Ga Mo thin film composites; Texture; X ray synchrotron diffraction

Indexed keywords

EID: 41849109670     PISSN: 0930486X     EISSN: None     Source Type: Journal    
DOI: 10.1524/zksu.2007.2007.suppl_26.229     Document Type: Conference Paper

References (9)

1. Chernenko, V.A., Kohl, M., L'vov, V.A., Kniazkyi, V.M., Ohtsuka, M., & Kraft, O., 2006, Mater. Trans. 47, 619.
2. Chernenko, V.A., Kohl, M., Doyle, S., Müllner, P., & Ohtsuka, M., 2006, Scr. Mater. 54, 1287.
3. Rumpf, H., Feydt, J., Levandovski, D., Ludwig, A., Winzek, B., Quandt, E., Zhao, P., & Wuttig M., 2003, Proc SPIE 5053, 191.
4. Kohl, M., Agarwal, A., Chernenko, V.A., Ohtsuka, M., & Seemann, K., 2006, Mater. Sci. Eng. A 438-440, 940.
5. ANKA Beamline Book 2005, www.fzk.de/anka. Forschungszentrum Karlsruhe, Germany.
6. Mullins, W. W., 1958, Acta Metall. 6, 414.
7. Thompson, C. V., 1990, Annu. Rev. Mater. Sci. 20, 245.
8. Thompson, C. V., 2000, Annu. Rev. Mater. Sci. 30, 159.
9. Liu, Y. S., Delannay, L., & Van Houtte, P., 2002, Acta Mater. 50, 1846.