메뉴 건너뛰기




Volumn , Issue , 2006, Pages 1093-1096

Measurements of coaxial dielectric samples employing both transmission/reflection and resonant techniques to enhance air-gap corrections

Author keywords

[No Author keywords available]

Indexed keywords

COAXIAL CABLES; ELECTRIC LINES; PERMITTIVITY; RESONANT CIRCUITS;

EID: 41849106901     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MIKON.2006.4345376     Document Type: Conference Paper
Times cited : (4)

References (7)
  • 1
    • 0014882762 scopus 로고
    • Measurement of the intrinsic properties of materials by time domain techniques
    • Nov
    • A. M. Nicolson and G. F. Ross "Measurement of the intrinsic properties of materials by time domain techniques", IEEE Trans. Instrum. Meas., vol.19, pp 377-382 Nov.1970
    • (1970) IEEE Trans. Instrum. Meas , vol.19 , pp. 377-382
    • Nicolson, A.M.1    Ross, G.F.2
  • 3
    • 0025474631 scopus 로고
    • Improved technique for determining complex permittivity with the transmission/reflection method
    • Aug
    • J. Baker-Jarvis, E. J. Vanzura and W. A. Kissick "Improved technique for determining complex permittivity with the transmission/reflection method" IEEE Trans. Microwave Theory Tech vol. 38, pp. 1096-1103 Aug. 1990
    • (1990) IEEE Trans. Microwave Theory Tech , vol.38 , pp. 1096-1103
    • Baker-Jarvis, J.1    Vanzura, E.J.2    Kissick, W.A.3
  • 4
    • 41849095962 scopus 로고    scopus 로고
    • J. Baker-Jarvis, M.D. Janezic, Bill Riddle, Robert T. Johnk, Christopher L. Holloway, Pavel Kabos, Chriss Grosvenor, Dielectric Measurements on Lossy Materials: Solids, Liquids, Building Materials, and NIM Materials, NIST Tech. Note 1536, 2005
    • J. Baker-Jarvis, M.D. Janezic, Bill Riddle, Robert T. Johnk, Christopher L. Holloway, Pavel Kabos, Chriss Grosvenor, "Dielectric Measurements on Lossy Materials: Solids, Liquids, Building Materials, and NIM Materials," NIST Tech. Note 1536, 2005
  • 5
    • 0032183775 scopus 로고    scopus 로고
    • A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature
    • Oct
    • J. Krupka, K. Derzakowski, B. Riddle and J. Baker-Jarvis, "A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature", Measurement Science and Technology, vol.9, pp. 1751-1756, Oct. 1998
    • (1998) Measurement Science and Technology , vol.9 , pp. 1751-1756
    • Krupka, J.1    Derzakowski, K.2    Riddle, B.3    Baker-Jarvis, J.4
  • 6
    • 41849086617 scopus 로고    scopus 로고
    • RF Material Characterization Using a Large Diamter (76.8 mm) Coaxial Line
    • C. A. Jones, J. H. Grosvenor, C. M. Weil, "RF Material Characterization Using a Large Diamter (76.8 mm) Coaxial Line", NIST Tech Note 1517, 2000.
    • (2000) NIST Tech Note , vol.1517
    • Jones, C.A.1    Grosvenor, J.H.2    Weil, C.M.3
  • 7
    • 0028546976 scopus 로고
    • Intercomparison of Permittivity Measurements Using the Transmission/Reflection Method in 7 mm Coaxial Transmission Lines
    • E. Vanzura, J. Baker-Jarvis, J. Grosvenor, M. D. Janezic, "Intercomparison of Permittivity Measurements Using the Transmission/Reflection Method in 7 mm Coaxial Transmission Lines", IEEE Trans. Microwave Theory Tech, vol. 42, pp. 2063-2070, 1994.
    • (1994) IEEE Trans. Microwave Theory Tech , vol.42 , pp. 2063-2070
    • Vanzura, E.1    Baker-Jarvis, J.2    Grosvenor, J.3    Janezic, M.D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.