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Journal of Chemical Physics

Volumn 128, Issue 13, 2008, Pages

Photofragmentation of Si F4 upon Si 2p and F 1s core excitation: Cation and anion yield spectroscopy

(5) Piancastelli, M N a Stolte, W C b Guillemin, R c Wolska, A d Lindle, D W b

a UPPSALA UNIVERSITY (Sweden)

b UNIVERSITY OF NEVADA (United States)

c SORBONNE UNIVERSITÉ (France)

d INSTITUTE OF PHYSICS (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

IONIZATION; NEGATIVE IONS; PHOTOEXCITATION; POSITIVE IONS; RYDBERG STATES; SILICON COMPOUNDS; X RAY ANALYSIS;

ANION YIELD SPECTROSCOPY; CATION YIELD SPECTROSCOPY; CORE EXCITATION; FRAGMENTATION DYNAMICS; IONIC FRAGMENTS; PHOTOFRAGMENTATION; SHAPE RESONANCE;

MOLECULAR DYNAMICS;

EID: 41849101036 PISSN: 00219606 EISSN: None Source Type: Journal
DOI: 10.1063/1.2851135 Document Type: Article

Times cited : (8)

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