Electrodeposition of crack-free CuGa Se2 thin films from single bath

Journal of the Electrochemical Society

Volumn 155, Issue 5, 2008, Pages

  Oda, Yusuke ^a   Minemoto, Takashi ^a   Takakura, Hideyuki ^a  

^a RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; CRACK PROPAGATION; ELECTRODEPOSITION; X RAY DIFFRACTION ANALYSIS;

PRECURSOR THIN FILMS; SINGLE BATH;

THIN FILMS;

EID: 41849086694     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2845071     Document Type: Article

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