Small-signal analysis of decananometer bulk and SOI MOSFETs for analog/mixed-signal and RF applications using the time-dependent Monte Carlo approach

IEEE Transactions on Electron Devices

Volumn 54, Issue 9, 2007, Pages 2283-2292

  Eminente, Simone ^a,b   Barin, Nicola ^b,c   Palestri, Pierpaolo ^b,d   Fiegna, Claudio ^a,b   Sangiorgi, Enrico ^a,b  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b Italian Universities Nanoelectronic Team   (Italy)

^c UNIVERSITY OF FERRARA   (Italy)

^d UNIVERSITY OF UDINE   (Italy)

Author keywords

CMOS scaling; Device simulation; Monte Carlo (MC); MOSFET; Radio frequency (RF)

Indexed keywords

BANDWIDTH; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; EQUIVALENT CIRCUITS; MONTE CARLO METHODS; SIGNAL ANALYSIS;

ANALOG/MIXED-SIGNAL; DRIFT-DIFFUSION APPROACH; TRANSITION FREQUENCY;

MOSFET DEVICES;

EID: 41749118747     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2007.902860     Document Type: Article

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