Determining components of series resistance from measurements on a finished cell

Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4

Volumn 2, Issue , 2006, Pages 1315-1318

  Meier, D L ^a   Good, E A ^a   Garcia, R A ^a   Bingham, B L ^a   Yamanaka, S ^a   Chandrasekaran, V ^a   Bucher, C ^a  

^a Solar Power Industries   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT RESISTANCE; CRYSTALLINE MATERIALS; SILICON SOLAR CELLS; THICKNESS MEASUREMENT;

EMITTER SHEET; FINISHED CELLS; GRIDLINES; SERIES RESISTANCE;

PHOTOVOLTAIC CELLS;

EID: 41749106663     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WCPEC.2006.279656     Document Type: Conference Paper

References (2)

1. D. L. Meier and D. K. Schroder, "Contact Resistance: Its Measurement and Relative Importance to Power Loss in a Solar Cell", IEEE Trans. Electron Devices, ED-31,1984, pp. 647-653.
2. A. L. Fahrenbruch and R. H. Bube, Fundamentals of Solar Cells, Academic Press, 1983. pp. 220 - 222.