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Volumn 470, Issue 1-2, 2008, Pages 40-46

TPR and XPS characterization of chromia-lanthana-zirconia catalyst prepared by impregnation and microwave plasma enhanced chemical vapour deposition methods

Author keywords

Chromia containing catalysts; Chromia lanthana zirconia; Impregnation; PECVD; Temperature programmed reduction; TPR; XPS

Indexed keywords

CHROMIUM COMPOUNDS; IMPREGNATION; LANTHANUM COMPOUNDS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; TEMPERATURE PROGRAMMED DESORPTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 41749096340     PISSN: 00406031     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tca.2008.01.019     Document Type: Article
Times cited : (21)

References (29)
  • 10
    • 41749090324 scopus 로고    scopus 로고
    • H. Lieske, D.L. Hoang, US Patent 6,239,323 B1 (2001).
    • H. Lieske, D.L. Hoang, US Patent 6,239,323 B1 (2001).
  • 18
    • 41749106285 scopus 로고    scopus 로고
    • A. Dittmar, Thesis, June 2002, URL: http://edocs.tu-berlin.de/diss/2002/dittmar_andrea.pdf.
    • A. Dittmar, Thesis, June 2002, URL: http://edocs.tu-berlin.de/diss/2002/dittmar_andrea.pdf.
  • 21
    • 41749111432 scopus 로고    scopus 로고
    • NIST X-ray Photoelectron Spectroscopy Database (http://www.nist.gov).
    • NIST X-ray Photoelectron Spectroscopy Database (http://www.nist.gov).
  • 27
    • 41749096644 scopus 로고    scopus 로고
    • S.S. Farrage, Thesis, Humboldt-Universität, Berlin, 2005.
    • S.S. Farrage, Thesis, Humboldt-Universität, Berlin, 2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.