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Volumn 2, Issue , 2006, Pages 1308-1311
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Investigation of the effect of resistivity and thickness on the performance of cast multicrystalline silicon solar cells
a,b a a a a c
c
NONE
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALLINE MATERIALS;
ELECTRIC CONDUCTIVITY;
SILICON WAFERS;
SINGLE CRYSTALS;
DOPANT-DEFECT INTERACTION;
MULTICRYSTALLINE SILICON WAFERS;
OPTIMUM RESISTIVITY;
SILICON SOLAR CELLS;
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EID: 41749095334
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/WCPEC.2006.279654 Document Type: Conference Paper |
Times cited : (2)
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References (9)
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