Intelligent monitoring and diagnosis of manufacturing processes using an integrated approach of KBANN and GA

Computers in Industry

Volumn 59, Issue 5, 2008, Pages 489-501

  Yu, Jianbo ^a   Xi, Lifeng ^a   Zhou, Xiaojun ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Data mining; Fault diagnosis; Genetic algorithm; Intelligent monitoring; Knowledge based artificial neural network

Indexed keywords

DATA MINING; FAULT DETECTION; GENETIC ALGORITHMS; INTEGRATED CONTROL; INTELLIGENT SYSTEMS; KNOWLEDGE BASED SYSTEMS; NEURAL NETWORKS;

KNOWLEDGE-BASED ARTIFICIAL NEURAL NETWORKS; LEARNING-BASED MODELS; ON-LINE INTELLIGENT MONITORING;

MANUFACTURING DATA PROCESSING;

EID: 41649120734     PISSN: 01663615     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.compind.2007.12.005     Document Type: Article

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