Synchrotron X-ray microtomography: A new tool to characterize the interaction between paper and toner

Journal of Imaging Science and Technology

Volumn 52, Issue 1, 2008, Pages 010502-0105026

  Vernhes, P ^a   Du Roscoat, S Rolland ^a,b   Blayo, A ^a   Pineaux, B ^a   Thibault, X ^b   Bloch, J F ^a  

^a INP Grenoble EFPG   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; IMAGING SYSTEMS; PROFILOMETRY; SYNCHROTRONS;

TONER PROPERTIES; X RAY MICROTOMOGRAPHY;

TOMOGRAPHY;

EID: 41649084574     PISSN: 10623701     EISSN: None     Source Type: Journal    
DOI: 10.2352/J.ImagingSci.Technol.(2008)52:1(010502)     Document Type: Article

References (14)

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