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Volumn 982, Issue , 2006, Pages
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Electron Microscopy Across Hard and Soft Materials
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON;
CHEMICAL VAPOR DEPOSITION;
CRYSTALLOGRAPHY;
KINETICS;
SCANNING ELECTRON MICROSCOPY;
SILICON CARBIDE;
INELASTIC MEAN FREE PATH;
SEGMENTATION TECHNIQUES;
SILICON CARBIDE FIBERS;
MATERIALS SCIENCE;
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EID: 41549143317
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Review |
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Times cited : (1)
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References (0)
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