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Volumn 985, Issue , 2007, Pages 71-76
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Helium migration mechanisms in polycrystalline uranium dioxide
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Author keywords
[No Author keywords available]
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Indexed keywords
DEPTH PROFILING;
GRAIN BOUNDARIES;
HELIUM;
MICROSTRUCTURE;
POLYCRYSTALLINE MATERIALS;
SINTERING;
HELIUM MIGRATION;
NUCLEAR REACTION ANALYSIS;
URANIUM DIOXIDE;
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EID: 41549141918
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (5)
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References (6)
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