The importance of EBIT data for Z-pinch plasma diagnostics

Canadian Journal of Physics

Volumn 86, Issue 1, 2008, Pages 267-276

  Safronova, A S ^a   Kantsyrev, V L ^a   Neill, P ^a   Safronova, U I ^a   Fedin, D A ^a   Ouart, N D ^a   Yilmaz, M F ^a   Osborne, G ^a   Shrestha, I ^a   Williamson, K ^a   Hoppe, T ^a,b   Harris, C ^c   Beiersdorfer, P ^d   Hansen, S ^d  

^a UNIVERSITY OF NEVADA   (United States)

^b DREXEL UNIVERSITY   (United States)

^c Gulf Coast Community College   (United States)

^d LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; IONS; POLARIMETERS; SPECTROSCOPIC ANALYSIS;

ELECTRON BEAM ION TRAP (EBIT); LAWRENCE LIVERMORE NATIONAL LABORATORY (LLNL);

PLASMA DIAGNOSTICS;

EID: 41549128807     PISSN: 00084204     EISSN: None     Source Type: Journal    
DOI: 10.1139/P07-170     Document Type: Conference Paper

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