NanoCT: Visualizing of internal 3D-structures with submicrometer resolution

Materials Research Society Symposium Proceedings

Volumn 990, Issue , 2007, Pages 325-331

  Brunke, Oliver ^a   Neuber, Dirk ^b   Lehmann, David K ^c  

^a Phoenix x Ray   (Germany)

^b Phoenix x Ray   (Germany)

^c Phoenix x Ray   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE QUALITY; MICROANALYSIS; MICROSTRUCTURE; OPTICAL RESOLVING POWER; PIXELS; POROSITY; THREE DIMENSIONAL;

SAMPLE PREPARATION; SUBMICROMETER RESOLUTION; VOLUME VISUALIZATION;

COMPUTERIZED TOMOGRAPHY;

EID: 41549103471     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-0990-b05-09     Document Type: Conference Paper

References (4)

1. BONSE, U. (Editor) (2004), SPIE Conference Proceedings: Developments in X-Ray Tomography IV, SPIE Press
2. BARUCHEL, J., J.-Y. BUFFIERE, E. MAIRE, P. MERLE, AND P. GILLES (2000), X-Ray Tomography in Material Science, Hermes Science Publications.
3. KAK, A.C. AND M. SLANEY (1999), Principles of Computerized Tomographic Imaging, IEEE Press
4. FELDKAMP, L.A., L. DAVID, AND J. KRESS (1984), Practical Cone Beam Algorithm. Journal of the Optical Society of America, 1 612-619.