Microstructural studies of bulk and thin film GDC

Ionics

Volumn 14, Issue 2, 2008, Pages 165-171

  Muthukkumaran, K ^a,c   Kuppusami, P ^b   Kesavamoorthy, R ^b   Mathews, T ^b   Mohandas, E ^b   Raghunathan, V S ^b   Selladurai, S ^a  

^a ANNA UNIVERSITY   (India)

^b INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

^c MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Atomic force microscopy; Doped ceria; Microstructure; Pulsed laser deposition; Raman spectroscopy; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROSTRUCTURE; PULSED LASER DEPOSITION; RAMAN SPECTROSCOPY; RARE EARTHS; SCANNING ELECTRON MICROSCOPY;

MICROSTRUCTURAL PROPERTIES; THIN FILM GDC;

THIN FILMS;

EID: 41549086956     PISSN: 09477047     EISSN: 18620760     Source Type: Journal    
DOI: 10.1007/s11581-007-0152-5     Document Type: Article

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