New de-embedding technique based on cold-FET measurement

Proceedings of the 1st European Microwave Integrated Circuits Conference, EuMIC 2006

Volumn , Issue , 2006, Pages 460-463

  Pailloncy, G ^a   Raskin, J P ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

De embedding technique; Field effect transistors; High frequency performances

Indexed keywords

ELECTROMAGNETIC DISPERSION; EMBEDDED SYSTEMS; WAFER BONDING;

DE-EMBEDDING TECHNIQUES; HIGH FREQUENCY PERFORMANCES;

FIELD EFFECT TRANSISTORS;

EID: 41549085163     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EMICC.2006.282682     Document Type: Conference Paper

References (3)

1. R. Anholt, S. Swirhum, "Measurement and Analysis of GaAs MESFET Parasitic Capacitances", IEEE Transactions on Microwave Theory and Techniques, vol. 39, no. 7, pp. 1247-1251, 1991.
2. G. Dambrine, A. Cappy, F. Heliodore, E. Playez, "A new method for determining the FET small-signal equivalent circuit", IEEE Transactions on Microwave Theory and Techniques, vol. 36, no. 7, pp. 1151-1159, 1988.
3. www.cascademicrotech.com