Low-temperature scaling of the susceptibility of Ni films

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 9, 2008, Pages

  Song, X H ^a   Zhang, X G ^b   Fan, J ^a   Jin, Y R ^a   Su, S K ^a   Zhang, D L ^a  

^a INSTITUTE OF PHYSICS   (China)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 41549084123     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.092408     Document Type: Article

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