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Volumn 23, Issue 4, 2008, Pages 588-591
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Use of microwave induced plasma spectrometry as detector for the determination of O, N and H traces after carrier gas hot extraction
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Author keywords
[No Author keywords available]
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Indexed keywords
CALIBRATION;
EXTRACTION;
INDUCTIVELY COUPLED PLASMA;
SENSITIVITY ANALYSIS;
SIGNAL TO NOISE RATIO;
WAVELENGTH;
CALIBRATION INTERVAL;
CARRIER GAS;
MICROWAVE INDUCED PLASMA SPECTROMETRY;
TRACE ELEMENTS;
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EID: 41549083374
PISSN: 02679477
EISSN: 13645544
Source Type: Journal
DOI: 10.1039/b714734a Document Type: Article |
Times cited : (5)
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References (4)
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