Surface event rejection of the EDELWEISS cryogenic germanium detectors based on NbSi thin film sensors

Journal of Low Temperature Physics

Volumn 151, Issue 3-4 PART 2, 2008, Pages 835-840

  Marnieros, Stefanos ^a   Berge, L ^a   Broniatowski, A ^a   Chapellier, M ^a   Collin, S ^a   Crauste, O ^a   Defay, X ^a   Dolgorouky, Y ^a   Dumoulin, L ^a   Juillard, A ^a   Lalu, F ^a   Nones, C ^a   Olivieri, E ^a  

^a CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

Author keywords

Cryogenic detectors; Dark matter; Ge bolometer; NbSi thermistor; Surface event rejection

Indexed keywords

CRYOGENIC DETECTORS; HEAT THRESHOLD ENERGY; SURFACE EVENT REJECTION; THIN FILM SENSORS;

BOLOMETERS; CALIBRATION; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON COMPOUNDS; TEMPERATURE SENSORS; THERMISTORS; THIN FILMS;

CRYOGENICS;

EID: 41449095640     PISSN: 00222291     EISSN: 15737357     Source Type: Journal    
DOI: 10.1007/s10909-008-9753-2     Document Type: Article

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