Integral equation and sensitivity analyses of creep behavior for PVDF thin films

Mechanics of Materials

Volumn 40, Issue 7, 2008, Pages 594-601

  Frankel, J I ^a   Chisholm, C ^a  

^a University of Tennessee   (United States)

Author keywords

Compliance; Linear viscoelasticity; Sensitivity analysis; Strain; Stress; Volterra equations

Indexed keywords

INTEGRAL EQUATIONS; LAPLACE TRANSFORMS; PHYSICAL VAPOR DEPOSITION; VISCOELASTICITY;

CREEP BEHAVIOR; PIEZOELECTRIC POLYMERS; VOLTERRA EQUATIONS;

THIN FILMS;

EID: 41449084580     PISSN: 01676636     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mechmat.2008.02.001     Document Type: Article

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