Relaxation of low mismatched semiconducting layers by misfit dislocations: Models and observations

Journal De Physique. IV : JP

Volumn 8, Issue 4, 1997, Pages

  Pichaud, B ^a   Putero, M ^a   Burle, N ^a  

^a AIX MARSEILLE UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); MATHEMATICAL MODELS; PLASTIC DEFORMATION; SEMICONDUCTING FILMS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING GERMANIUM COMPOUNDS; SEMICONDUCTING SILICON; STACKING FAULTS; THICKNESS MEASUREMENT; X RAY ANALYSIS;

LOW MISMATCHED SEMICONDUCTING LAYERS;

RELAXATION PROCESSES;

EID: 4143154188     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

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