EXAFS investigations on highly-ordered ultrathin films of Me-DCNQI on single crystal surfaces

Journal De Physique. IV : JP

Volumn 7, Issue 2 Part 1, 1997, Pages

  Bassler M ^a   Fink, R ^a   Buchberger, Chr ^a   Gador, D ^a   Heske, C ^a   Muller J ^a   Vaterlein P ^a   Von Schutz J U ^b   Umbach, ^a  

^a UNIVERSITY OF WÜRZBURG   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4143143222     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (6)

1. Aumüller A., Hünig S., Lieb. Ann. Chem. Vol. 142 (1984) 165; von Schütz, J. U. et al., Synth. Met. 27 (1988) B249
2. Aumüller A., Hünig S., Lieb. Ann. Chem. Vol. 142 (1984) 165; von Schütz, J. U. et al., Synth. Met. 27 (1988) B249
3. Bässler M. et al. Thin Solid Films (1996) in print
4. Stöhr J., NEXAFS Spectroscopy (Springer Berlin Heidelberg New York, 1992)
5. Schmeisser D. et al., Synth. Met. 41 (1991) 1809
6. Bässler M., Jung M. et al., to be published