Defects in and applications of III-V nitride semiconductors

Materials Science Forum

Volumn 239-241, Issue , 1997, Pages 119-144

  Morkoc H ^a,b  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

Defects; Electrical and Optical Devices; III V Nitrides

Indexed keywords

CHARACTERIZATION; CRYSTAL DEFECTS; ELECTRON DEVICES; ELECTRONIC STRUCTURE; LIGHT EMITTING DIODES; NITRIDES; OPTICAL DEVICES; SEMICONDUCTOR DEVICE MANUFACTURE; SPECTRUM ANALYSIS;

BANDGAPS; NEGATIVE ELECTRON AFFINITY SURFACE; SEMICONDUCTOR DISPLAYS;

SEMICONDUCTOR MATERIALS;

EID: 4143135393     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

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