XPS studies of single crystals of Bi-2212, Tl-2212 and Tl-2223

Journal De Physique. IV : JP

Volumn 7, Issue 2 Part 1, 1997, Pages

  Sekhar, B R ^a   Studer, F ^a   Martin, C ^a   Srivastava, P ^b   Garg, K B ^b  

^a LABORATOIRE CRISMAT   (France)

^b UNIVERSITY OF RAJASTHAN   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4143132247     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4/1997104     Document Type: Article

References (6)

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