Characterization of ultra-thin quarter-wavelength matching layers of high frequency ultrasonic transducers

Proceedings of the IEEE Ultrasonics Symposium

Volumn 1, Issue , 2003, Pages 1048-1051

  Wang, Haifeng ^a   Cao, Wenwu ^a   Zhou, Qifa ^b   Shung, K Kirk ^b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b University of Southern California ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PHASE VELOCITY; QUARTER-WAVELENGTHS; ULTRA-THIN LAYERS; ULTRASONIC SPECTROSCOPY;

COLLOIDS; GLASS; OXIDES; PIEZOELECTRIC MATERIALS; POLYMERS; SILICA; SOL-GELS; SPECTROSCOPY; SUBSTRATES; THIN FILMS; TRANSDUCERS; VELOCITY;

ULTRASONIC DEVICES;

EID: 4143131157     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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4. X. M. Lu, T. L. Rhyue, N. Tea and L. S. Smith, "Transducer material characterization by transmission coefficient measurement", IEEE Ultrasonic Symp., pp. 1061-1064, 1998
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