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Materials Science Forum

Volumn 248-249, Issue , 1997, Pages 405-408

Ion beam analysis and applications in on-line monitoring of ion induced modifications of materials

(1) Avasthi, O K a

a INTER UNIVERSITY ACCELERATOR CENTRE (India)

Author keywords

Detector Telescope; Electronic Energy Loss; ERDA; RBS; Sputtering

Indexed keywords

CHEMICAL MODIFICATION; ELECTRON ENERGY LOSS SPECTROSCOPY; INTERFACES (MATERIALS); ION BEAMS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPUTTERING; SURFACE PROPERTIES;

ELASTIC RECOIL DETECTION ANALYSIS (ERDA); ION BEAM ANALYSIS;

MATERIALS SCIENCE;

EID: 4143109062 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.248-249.405 Document Type: Article

Times cited : (2)

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