메뉴 건너뛰기




Volumn 7, Issue 2 Part 1, 1997, Pages

Si-O-Si angle distribution in amorphous silica characterized by EXAFS multiple scattering calculations

Author keywords

[No Author keywords available]

Indexed keywords


EID: 4143105892     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (2)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.