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Volumn 7, Issue 2 Part 1, 1997, Pages
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Si-O-Si angle distribution in amorphous silica characterized by EXAFS multiple scattering calculations
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 4143105892
PISSN: 11554339
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (2)
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References (8)
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