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Volumn 1, Issue , 2003, Pages 96-99

Investigations of new materials, CTGS and CNGS, for SAW applications

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; ELECTRODES; FREQUENCY AGILITY; PIEZOELECTRIC DEVICES; QUARTZ; SENSITIVITY ANALYSIS; SENSORS; SUBSTRATES; THICKNESS MEASUREMENT; VELOCITY;

EID: 4143091693     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (13)

References (10)
  • 8
    • 85009702761 scopus 로고    scopus 로고
    • Modeling and experimental measurements of the reflection properties of SAW metallic gratings
    • P.V. Wright, "Modeling and Experimental Measurements of the Reflection Properties of SAW Metallic Gratings", 1984 IEEE International Ultrasonics Symposium Proceedings, pp. 54-63.
    • 1984 IEEE International Ultrasonics Symposium Proceedings , pp. 54-63
    • Wright, P.V.1
  • 9
    • 84939770497 scopus 로고
    • Analysis of metal-strip SAW gratings and transducers
    • May
    • Dong-Pei Chen and H. Haus, "Analysis of Metal-Strip SAW Gratings and Transducers", IEEE Transactions on Sonics and Ultrasonics, Vol. SU-32, No. 3, May 1985.
    • (1985) IEEE Transactions on Sonics and Ultrasonics , vol.SU-32 , Issue.3
    • Chen, D.-P.1    Haus, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.