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Volumn 1, Issue , 2003, Pages 96-99
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Investigations of new materials, CTGS and CNGS, for SAW applications
a
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Author keywords
[No Author keywords available]
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Indexed keywords
DEGRADATION;
ELECTRODES;
FREQUENCY AGILITY;
PIEZOELECTRIC DEVICES;
QUARTZ;
SENSITIVITY ANALYSIS;
SENSORS;
SUBSTRATES;
THICKNESS MEASUREMENT;
VELOCITY;
CNGS;
COUPLING COEFFICIENTS;
CTGS;
PARAMETER EXTRACTION;
REFLECTIVITY MEASUREMENTS;
ACOUSTIC SURFACE WAVE DEVICES;
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EID: 4143091693
PISSN: 10510117
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (13)
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References (10)
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