Radiation assurance for the space environment

2004 International Conference on Integrated Circuit Design and Technology, ICICDT

Volumn , Issue , 2004, Pages 323-333

  Barth, Janet L ^a   LaBel, Kenneth A ^a   Poivey, Christian ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; DOSIMETERS; HARDNESS TESTING; NAVIGATION; NONDESTRUCTIVE EXAMINATION; RADIATION EFFECTS; SENSITIVITY ANALYSIS; SPACE APPLICATIONS;

ELECTRONIC SYSTEM; SPACE MEMORY ORGANIZATION; SPACE-BASED SYSTEM; WORST CASE ANALYSIS (WCA);

ELECTRONIC EQUIPMENT MANUFACTURE;

EID: 4143079286     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (30)

1. C. Poivey, "Radiation Hardness Assurance for Space Systems," Notes from the 2002 IEEE Nuclear and Space Radiation Effects Short Course, Phoenix, AZ.
2. J. L. Barth, "Modeling Space Radiation Environments," Notes from the 1997 IEEE Nuclear and Space Radiation Effects Short Course, Snowmass, CO.
3. C. Dyer, "Space Radiation Environment Dosimetry," Notes from the 1998 IEEE Nuclear and Space Radiation Effects Short Course, Newport Beach, CA.
4. J. Mazur, Notes from the 2002 IEEE Nuclear and Space Radiation Effects Short Course, Phoenix, AZ.
5. J. Beaucour, T. Carriere, A. Gach, D. Laxague, and P. Poirot, "Total Dose Effects on Negative Voltage Regulator," IEEE Trans. Nuc. Sci., vol. 41, n°6, pp. 2420-2426, Dec. 1994.
6. S. Mc Clure, R. L. Pease, W. Will, and G. Perry, "Dependence of Total Dose Response of Bipolar Linear Microcircuits on Applied Dose Rate," IEEE Trans. Nuc. Sci., vol. 41, n°6, pp. 2544-2549, Dec. 1994.
7. A. H. Johnston, G. M. Swift, and B. G. Rax, "Total Dose Effects in Conventional Bipolar Transistors and Linear Integrated Circuits," IEEE Trans. Nuc. Sci., vol. 41,n°6, pp. 2427-2436, Dec. 1994.
8. A. H. Johnston, B. G. Rax, and C. I. Lee, "Enhanced Damage in Linear Bipolar Integrated Circuits at Low Dose Rates," IEEE Trans. Nuc. Sci., vol. 42, n°6, pp. 1650-1659, Dec. 1995.
9. R. L. Pease, "Total Dose Issues for Microelectronics in Space Systems," IEEE Trans. Nucl. Sci., vol. 43, n°2, pp. 442-452, Apr. 1996.
10. S.C. Witczak, R. D. Schrimpf, D. M. Fleetwood, K. F. Galloway, R. C. Lacoe, D. C. Mayer, J. M. Puhl, R. L. Pease, and J. Suehle, "Hardness Assurance Testing of Bipolar Junction Transistors at Elevated Irradiation Temperatures," IEEE Trans. Nuc. Sci., vol. 44, n°6, pp. 1989-2000, Dec. 1997.
11. R. L. Pease, M. Gehlhausen, "Elevated Temperature Irradiation of Bipolar Linear Microcircuits," IEEE Trans. Nucl. Sci., vol. S43, n°6, p. 3161-3166, Dec. 1996.
12. L. Bonora, J. P. David, "An attempt to define conservative conditions for total dose evaluation of bipolar ICs," IEEE Trans. Nucl. Sci., vol. 44, n°6, pp. 1974-1980, Dec. 1997.
13. C. Marshall, and P. Marshall, "Proton Effects and Test Issues for Satellite Designers, part B: Displacement Effect," 1999 IEEE NSREC short course, Norfolk, Jul. 1999.
14. R. A. Reed, P. W. Marshall, A. H. Johnston, J. L. Barth, C. J. Marshall, K. A. LaBel, M. D'O'dine, H. S. Kim, and M. A. Carts, "Emerging Optocoupler Issues with Energetic Particle-Induced Transients and Permanent Radiation Degradation," IEEE Trans. Nuc. Sci., vol. 45, n°6, pp. 2833-2841, Dec. 1998.
15. R. A. Reed, "Guideline for Ground Radiation Testing and Using Optocouplers in the Space Radiation Environment," NASA-GSFC report, Mar. 2002.
16. E. G. Stassinopoulos, G. J. Brucker, "Shortcomings in Ground Testing, Environment simulations, and Performance Predictions for Space Applications," RADECS 1991 Proceedings, pp. 3-16, 1992.
17. R. Koga, "Single Event Effect Ground Test Issues," IEEE Trans. Nucl. Sci., vol. 43, n°2, pp. 661-670, Apr. 1996.
18. S. Duzellier, R. Ecoffet, "Recent Trends in Single Event Effect Ground Testing," IEEE Trans. Nucl. Sci., vol. 43, n°2, pp. 671-677, Apr. 1996.
19. C. Poivey, J. L. Barth, R. A. Reed. K. A. LaBel, E. Stassinopoulos, and M. Xapsos, "Implications of Advanced Microelectronics Technologies for Heavy Ion Single Event Effect (SEE) Testing," RADECS 2001 proceedings, Grenoble, France.
20. J. G. Rollins, "Estimation of Proton Upset Rate from Heavy Ion Test Data," IEEE Trans. Nucl. Sci., vol. 37, n°6, pp. 1961-1965, Dec. 1990.
21. E.L. Petersen, "The Relationship of Proton and Heavy Ion Upset Thresholds," IEEE Trans. Nucl. Sci., vol. 39, n°6, pp. 1600-1604, Dec. 1992.
22. B. Doucin, T. Carriere, C. Poivey, P. Gamier, J. Beaucour, "Model of Single Event Upsets Induced by Space Protons in Electronic Devices," RADECS 1995 proceedings, pp. 402-408, 1996.
23. P. Calvel, C. Barillot, P. Lamothe, R. Ecoffet, S. Duzellier, and D. Falguere, "An Empirical Model for Predicting Proton Induced Upset," IEEE Trans. Nucl. Sci., vol. 43, n°6, pp. 2827-2832, Dec. 1996.
24. V.V. Miroshkin, M. G. Tverskoy, "A Simple Approach to SEU Cross Section Evaluation," IEEE Trans. Nucl. Sci.,vol. 45, n°6, pp. 2884-2890, Dec. 1998.
25. J. Barak, "Empirical Modeling of Proton Induced SEE Rates," IEEE Trans. Nucl. Sci., vol. 47, n°3, pp. 545-550, Jun. 2000.
26. K. A. LaBel, A. H. Johnston, J. L. Barth, R. A. Reed, and C. E. Barnes, "Emerging Radiation Hardness Assurance (RHA) issues: A NASA Approach for Space Flight Programs," IEEE Trans. Nucl. Sci., vol. 45, n°6, pp. 2727-2736, Dec. 1998.
27. R. A. Reed, C. Poivey, P. W. Marshall, K. A. LaBel, C. J. Marshall, S. Kniffm, J. L. Barth, and C. Seidleck, "Assessing the Impact of the Space Radiation Environment on Parametric Degradation and Single-Event Transients in Optocouplers," IEEE Trans. Nuc. Sci., vol. 48, n°6, pp. 2202-2209, Dec. 2001.
28. K. LaBel, "SEECA Single Event Effect Criticality Analysis, SEU propagation analysis: system level effects," http://radhome.gsfc.nasa.gov/ radhome/papers/seecai.htm, 1996.
29. R. L. Pease, and D. R. Alexander, "Hardness Assurance for Space Systems Microelectronics," Rad. Phys. Chem., vol. 43, n°1/2, pp. 191-204, 1994.
30. K. LaBel, and M. Gates, "Single-Event-Effect Mitigation From a System Perspective," IEEE Trans. Nucl. Sci., vol. 43, n°2, pp. 654-660, Apr. 1996.