Chemical-specific imaging of multicomponent metal surfaces on the nanometer scale by scanning tunneling spectroscopy

Applied Physics A: Materials Science and Processing

Volumn 62, Issue 6, 1996, Pages 571-573

  Bode, M ^a   Pascal, R ^a   Wiesendanger, R ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4143076523     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf01571695     Document Type: Article

References (8)

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8. J.A. Stroscio, D.T. Pierce, A. Davies, R.J. Celotta: Phys. Rev. Lett. 75, 2960 (1995)