Microstructural characterization of porous materials by two-dimensional X-ray refraction topography

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 241, Issue 1-3, 2004, Pages 225-229

  Harbich, K W ^a   Klobes, P ^a   Hentschel, M P ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

Al2O3 ceramics; Internal surface density; Pore size; Porosity fluctuation; X ray refraction topography

Indexed keywords

CHARACTERIZATION; CHEMICAL ANALYSIS; GRAIN SIZE AND SHAPE; IMAGE ANALYSIS; MICROMETERS; MICROSTRUCTURE; POROSITY; SURFACE TOPOGRAPHY;

INTERNAL SURFACE DENSITY; TWO-DIMENSIONAL TOPOGRAPHIC IMAGES;

POROUS MATERIALS;

ANALYTIC METHOD; CALIBRATION; CHEMICAL STRUCTURE; CONFERENCE PAPER; DENSITY; POROSITY; POWDER; PRIORITY JOURNAL; STRUCTURE ANALYSIS; SURFACE PROPERTY; TOPOGRAPHY; X RAY ANALYSIS;

EID: 4143052770     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.colsurfa.2004.04.074     Document Type: Conference Paper

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