Gun life improvement program

5Th IEEE International Vacuum Electronics Conference, IVEC 2004

Volumn , Issue , 2004, Pages 326-327

  Atkinson, John ^a   Grant, T ^a   Stockwell, B ^a   Levush, B ^b   Nelson, E ^c   Petillo, J ^d   Eppley, K ^d  

^a Communications and Power Industries ^*  (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

^d SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODE LOADING; POISONING; S-BAND COUPLED CAVITY DEVICES; THERMAL PERFORMANCE;

CATHODE RAYS; COATINGS; CODES (STANDARDS); ELECTRON BEAMS; LOADING; VACUUM APPLICATIONS; WEAR OF MATERIALS;

ELECTRON GUNS;

EID: 4143050185     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)