Probing localized states with spectrally resolved speckle techniques

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 66, Issue 2, 2002, Pages

  Cao, H ^a   Ling, Y ^a   Xu, J Y ^a   Burin, A L ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LASER EMISSIONS; SEMICONDUCTOR POWDER; SPECKLE CORRELATION METHODS; SPECKLE PATTERN;

CORRELATION METHODS; DYES; EMISSION SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GAIN CONTROL; MAXWELL EQUATIONS; SEMICONDUCTOR MATERIALS; TITANIUM DIOXIDE; TRANSPORT PROPERTIES;

SPECKLE;

EID: 41349122688     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.66.025601     Document Type: Article

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